Bobalo, Yuriy     Evaluation of functional device suitability considering both random technological deviations of its parameters from their nominal values and the process of components’ aging [Текст] / Yuriy Bobalo, Mykola Dyvak, Svitlana Krepych, Petro Stakhiv // Przeglad electrotechniczny. — Politechnika Opolska, 2008. — S. 224-228.