Melnyk, Roman     Semiconductor surface analysis by image silhouette and statistical features [Текст] / Roman Melnyk, Yuriy Kalychak // Perspective technologies and methods in MEMS design (MEMSTECH 2016) : pros. of ХІІ-th Intern. Conf., 20-24 april 2016, Lviv - Polyana, Ukraine / Min. of Education and Science of Nkraine, Lviv Polytechnic Nat. Univ. — Lviv : Lviv Polytechnic Publ. House, 2016. — P. 93-95.